TLAF™

Testchip Layout Autogeneration Framework

The STX Cadware Testchip Layout Autogenerator Framework (TLAF™) is a Cadence-based test structure autogenerator that provides a set of standard components and their testlines (frames) that can be used immediately. It also permits the user to specify custom components for integration into the framework if the Module Autogenerator Interface Specification (MAIS) API is followed.

Standard Components

• Basic Test Structures
  • Via Chains - single and dual
  • Combs
  • Short- and Long-Line Electromigration
  • Sheet Resistance
  • Kelvin resistor linewidth
  • Via and Via Stack Kelvin
• Device Test Structures
  • Capacitors
  • Diodes
  • Bipolar Transistors
  • Several kinds of MOS transistors

TLAF™ Concept